Show simple item record

dc.creator Tang, Longhuang
dc.date.accessioned 2024-09-27T22:19:42Z
dc.date.available 2024-09-27T22:19:42Z
dc.date.issued 2023
dc.identifier.uri http://hdl.handle.net/123456789/15423
dc.description.abstract A microwave absolute distance measurement method with ten-micron-level accuracy and meter-level range based on frequency domain interferometry is proposed and experimentally demonstrated for the first time. Theoretical analysis indicates that an interference phenomenon occurs instantaneously in the frequency domain when combining two homologous broad-spectrum microwave beams with different paths, and the absolute value of the distance difference between the two paths is only inversely proportional to the period of frequency domain interference fringes. The proof-of-principle experiments were performed to prove that the proposed method can achieve absolute distance measurement in the X-band with standard deviations of 15 m, 17 m, and 26 m and within ranges of 1.69 m, 2.69 m, and 3.75 m. Additionally, a displacement resolution of 100 microns was realized. The multi-target recognition performance was also verified in principle. Furthermore, at the expense of a slight decrease in ranging accuracy, a fast distance measurement with the single measurement time of 20 s was achieved by using a digitizer combined with a Fourier transform analyzer. Compared with the current microwave precision ranging technologies, the proposed method not only has the advantages of high precision, large range, and rapid measurement capability, but the required components are also easily obtainable commercial devices. The proposed method also has better complex engineering applicability, because the ten-micron-level ranging accuracy is achievable only by using a simple Fourier transform without any phase estimation algorithm, which greatly reduces the requirement for signal-to-noise ratio. es
dc.format.extent 13 p. es
dc.relation.ispartof Revista Sensors 23 es
dc.rights Acceso Abierto es
dc.title Microwave absolute distance measurement method with micron-level accuracy and meter-level range based on frequency domain interferometry es
dc.type Revista es
uade.subject.keyword Microondas es
uade.subject.descriptor Comunicación es
uade.subject.descriptor Electrónica es
uade.subject.descriptor Mediciones es
academic.materia.codigo 3.3.167 es
academic.materia.nombre Laboratorio de Mediciones Eléctricas y Electrónicas es
dc.rights.license Acceso Abierto es


Access

This item appears in the following Collection(s)

 

Show simple item record

 
 

Lima 775 - C1073AAO
Ciudad Autónoma de Buenos Aires

 

Sede Recoleta: Libertad 1340 - C1016ABB
Ciudad Autónoma de Buenos Aires

 

Campus Costa Argentina: Av. Intermédanos Sur 776
Pinamar, Provincia de Buenos Aires

 
 
 

Carreras acreditadas nacional e internacionalmente