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dc.creator Hills, Gage
dc.date.accessioned 2024-09-26T18:44:48Z
dc.date.available 2024-09-26T18:44:48Z
dc.date.issued 2021
dc.identifier.uri http://hdl.handle.net/123456789/15422
dc.description.abstract Carbon nanotube (CNT) field-effect transistors (CNFETs) promise to improve the energy efficiency of very-large-scale integrated (VLSI) systems. However, multiple challenges have prevented VLSI CNFET circuits from being realized, including inherent nano-scale material defects, robust processing for yielding complementary CNFETs (i.e., CNT CMOS: including both PMOS and NMOS CNFETs), and major CNT variations. In this talk, we summarize techniques that we have recently developed to overcome these outstanding challenges, enabling VLSI CNFET circuits to be experimentally realized today using standard VLSI processing and design flows. Leveraging these techniques, we demonstrate the most complex CNFET circuits and systems to-date, including a three-dimensional (3D) imaging system comprising CNFETs fabricated directly on top of a silicon imager, CNT CMOS analog and mixed-signal circuits, 1 kilobit CNFET static random-access memory (SRAM) memory arrays, and a 16-bit RISC-V microprocessor built entirely out of CNFETs. es
dc.format.extent 1 p. es
dc.relation.ispartof 2021 International Symposium on Physical Design (ISPD '21) [Simposio] es
dc.rights Acceso Abierto
dc.title Advances in carbon nanotube technologies: From transistors to a RISC-V microprocessor es
dc.type ArtRev es
uade.subject.descriptor Electrónica es
uade.subject.descriptor Circuitos Electrónicos es
uade.subject.descriptor Transistores es
academic.materia.codigo 3.3.068 es
academic.materia.nombre Fundamentos de Electrónica es
dc.rights.license Acceso Abierto


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