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dc.creator | Bentley, John P. | |
dc.date.accessioned | 2021-05-11T13:10:55Z | |
dc.date.available | 2021-05-11T13:10:55Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | http://hdl.handle.net/123456789/13147 | |
dc.description.abstract | Part A General Principles -- 1 The General Measurement System -- 2 Static Characteristics of Measurement System Elements -- 3 The Accuracy of Measurement Systems in the Steady State -- 4 Dynamic Characteristics of Measurement Systems -- 5 Loading Effects and Two-port Networks -- 6 Signals and Noise in Measurement Systems -- 7 Reliability, Choice and Economics of Measurement Systems -- Part B Typical Measurement System Elements -- 8 Sensing Elements -- 9 Signal Conditioning Elements -- 10 Signal Processing Elements and Software -- 11 Data Presentation Elements -- Part C Specialised Measurement Systems -- 12 Flow Measurement Systems -- 13 Intrinsically Safe Measurement Systems -- 14 Heat Transfer Effects in Measurement Systems -- 15 Optical Measurement Systems -- 16 Ultrasonic Measurement Systems -- 17 Gas Chromatography -- 18 Data Acquisition and Communication Systems -- 19 The Intelligent Multivariable Measurement System | es |
dc.language.iso | en | es |
dc.publisher | Pearson Education | es |
dc.title | Principles of measurement systems | es |
uade.subject.descriptor | Ingeniería | es |
uade.subject.descriptor | Electrónica | es |
uade.subject.descriptor | Sistemas de Medición | es |
uade.edicion | 4th ed. | es |
uade.identifier.isbn | 0130430285 | es |
academic.materia.codigo | 3.3.126 | es |
academic.materia.nombre | Laboratorio de Mediciones Electrónicas | es |